smartctl 7.3 2022-02-28 r5338 [NetBSD 10.0 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     SanDisk SSD i110 16GB
Serial Number:    --
LU WWN Device Id: 5 001b44 ...
Firmware Version: i221000
User Capacity:    16,013,942,784 bytes [16.0 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Form Factor:      1.8 inches
TRIM Command:     Available, deterministic
Device is:        Not in smartctl database 7.3/5319
ATA Version is:   ACS-2 T13/2015-D revision 3
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Thu Apr  4 05:48:21 2024 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  120) seconds.
Offline data collection
capabilities: 			 (0x51) SMART execute Offline immediate.
					No Auto Offline data collection support.
					Suspend Offline collection upon new
					command.
					No Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (   3) minutes.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0002   100   100   000    Old_age   Always       -       0
  9 Power_On_Hours          0x0002   100   100   000    Old_age   Always       -       3463
 12 Power_Cycle_Count       0x0002   100   100   000    Old_age   Always       -       1351
165 Unknown_Attribute       0x0002   100   100   000    Old_age   Always       -       510902
171 Unknown_Attribute       0x0002   100   100   000    Old_age   Always       -       0
172 Unknown_Attribute       0x0002   100   100   000    Old_age   Always       -       0
173 Unknown_Attribute       0x0002   100   100   000    Old_age   Always       -       255
174 Unknown_Attribute       0x0002   100   100   000    Old_age   Always       -       155
187 Reported_Uncorrect      0x0002   100   100   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0022   044   056   000    Old_age   Always       -       56 (Min/Max 16/63)
230 Unknown_SSD_Attribute   0x0002   100   100   000    Old_age   Always       -       850
232 Available_Reservd_Space 0x0003   100   100   005    Pre-fail  Always       -       0
234 Unknown_Attribute       0x0002   100   100   000    Old_age   Always       -       750
241 Total_LBAs_Written      0x0002   100   100   000    Old_age   Always       -       4328501917
242 Total_LBAs_Read         0x0002   100   100   000    Old_age   Always       -       9418323638

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

